Microwave Reliability

BAE Systems’ reliability lab performs reliability and qualification testing of microwave and millimeter-wave devices, monolithic microwave integrated circuits (MMICs), and modules for high-reliability applications. The tests include high temperatures, DC and radio frequency electrical bias, and environmental stress, providing an overall product assessment including design, material, and processing factors.

BAE Systems has qualified a wide range of device technologies for high-reliability space and military applications. These include 0.1 µm and 0.15 µm, low-noise and power pseudomorphic high electron mobility transistors; a 0.1 µm, low-noise inidum phosphide high electron mobility transistor; and a 0.1 µm, low-noise metamorphic high electron mobility transistor.

MMIC qualification typically includes a DC or RF burn-in and high-temperature accelerated life test, a room-temperature RF overdrive life test, front and backside metallization adhesion tests, and SEM inspection of critical areas. Module qualification typically includes electrical characterization, temperature cycling, fine/gross leak check, shock/vibration, steady-state life test, and internal water vapor tests.

BAE Systems also specializes in evaluation and mitigation of MMIC hydrogen poisoning effects commonly observed within hermetic modules. Temperature-humidity-bias testing is commonly performed for non-hermetic application environments. In addition to reliability testing, the group also performs detailed failure analysis of MMICs and modules using electrical characterization and a variety of analytical instruments.

The reliability test lab is well equipped; life test data collection and analysis is automated, and great care is taken to ensure the integrity of test data by providing uninterruptible power supply and generator backup in the event of power disruption.

 

For more information, please contact:
Pane Chao
Tel: +1 603 885 6695
pane.chao@baesystems.com