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Microwave substrate facility
Our reliability lab performs reliability/qualification testing of microwave and millimeter-wave devices, monolithic microwave integrated circuits (MMICs), and modules for high-rel applications. The tests are typically carried out by applying high temperatures, DC and RF electrical bias, and environmental stress to the units under test, that provides an overall product assessment including design, material and processing factors. BAE Systems has qualified a wide range of device technologies for high-rel space and military applications. These include 0.1 µm and 0.15 µm, low-noise and power Pseudomorphic High Electron Mobility Transistors (PHEMTs); a 0.1 µm, low-noise inidum phosphide (InP) High Electron Mobility Transistor (HEMT); and a 0.1 µm, low-noise Metamorphic High Electron Mobility Transistor (MHEMT). Efforts are ongoing to assess and improve the reliability of power MHEMT and gallium nitride (GaN) HEMT technologies.
MMIC qualification typically includes a DC or RF burn-in and high-temperature accelerated life test, a room-temperature RF overdrive life test, front and backside metallization adhesion tests and SEM inspection of critical areas. Module qualification typically includes electrical characterization, temperature cycling, fine/gross leak check, shock/vibration, steady-state life test and internal water vapor tests.
BAE Systems also specializes in evaluation and mitigation of MMIC hydrogen poisoning effects commonly observed within hermetic modules. Alternatively, temperature-humidity-bias testing is commonly performed for non-hermetic application environments. In addition to reliability testing, we also perform detailed failure analysis of MMICs and modules using extensive electrical characterization and a variety of analytical instruments.
Our reliability test lab is well equipped, with test racks capable of life testing either at DC or RF, where RF stands cover several distinct bands through 60 GHz. Life test data collection and analysis is highly automated, and great care has been taken to ensure the integrity of test data by providing uninterruptible power supply and generator backup in the event of power disruption.
For further information please contact:
+1 603-885-6695
